Subject description - BE3M38DIT

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BE3M38DIT Diagnostics and Testing
Roles:PO, P, V Extent of teaching:3P+2L
Department:13138 Language of teaching:EN
Guarantors:Šmíd R. Completion:Z,ZK
Lecturers:Šmíd R. Credits:7
Tutors:Avetisyan H., Šmíd R., Tereň O. Semester:L


The course introduces the fundamentals of the fault-detection, fault tolerance, machine condition monitoring, vibrations based diagnostics, non-destructive testing and testing of analog and digital circuits.

Course outlines:

1. Diagnostics, prognostics, life cycle
2. Fault modelling, signal/model based fault detection
3. Reliability
4. Fault tolerance, static/dynamic/analytical redundancy, FMEA, FMECA
5. Performance evaluation of diagnostic methods (POD)
6. Diagnostic signal sources and analysis, preprocessing
7. Envelope, cepstral, order analysis, analysis of non-stationary signal
8. Diagnostics of mechanical, electrical and electromechanical systems
9. Diagnostics based on impulse and continuous acoustic emission
10. Non-destructive Testing (NDT), Detection and Localization
11. Ultrasonic NDT, Eddy Current NDT, active thermography
12. Testing of analog and digital circuits, production testing
13. In-circuit Testing, Built-in Self Test, Design for Test
14. Test generation, fault masking, test compression, boundary scan

Exercises outline:

1. Introduction to Diagnostics, Course Information, Schedule, Lab Practice and Electrical Safety
2. Laboratory Experiment:Fault detection using thermography
3. Laboratory Experiment: Vibrodiagnostics of shaft/gearbox
4. Laboratory Experiment: Eddy Current Non-destructive Testing
5. Laboratory Experiment: Ultrasonic Non-destructive Testing
6. Quiz, Assignment of Individual Project
7. Individual Project
8. Individual Project
9. Individual Project
10. Individual Project
11. Individual Project
12. Individual Project
13. Individual Project
14. Presentation of Individual Project, Assessment


[1] R. Isermann: Fault-Diagnosis Systems, Springer Verlag, 2006.
[2] Ch. Hellier: Handbook of Nondestructive Evaluation, McGraw-Hill 2012.
[3] M. L. Bushnell, V.D. Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Springer, Boston, 2005.


Subject is included into these academic programs:

Program Branch Role Recommended semester
MEEK1_2016 Communication Systems and Networks V
MEKYR5_2016 Cybernetics and Robotics P 2
MEKYR4_2016 Aerospace Systems P 2
MEKYR3_2016 Systems and Control P 2
MEKYR2_2016 Sensors and Instrumentation P 2
MEKYR1_2016 Robotics P 2
MEEK3_2016 Electronics PO 2
MEEK2_2016 Radio and Optical Technology V
MEEK4_2016 Media and Signal Processing V

Page updated 6.8.2020 09:51:54, semester: Z,L/2020-1, L/2019-20, Send comments about the content to the Administrators of the Academic Programs Proposal and Realization: I. Halaška (K336), J. Novák (K336)