Popis předmětu - BE3M38DIT
Přehled studia |
Přehled oborů |
Všechny skupiny předmětů |
Všechny předměty |
Seznam rolí |
Vysvětlivky
Návod
Optional:
| BE3M38DIT | Diagnostics and Testing | ||
|---|---|---|---|
| Role: | Rozsah výuky: | 3P+2L | |
| Katedra: | 13138 | Jazyk výuky: | EN |
| Garanti: | Zakončení: | Z,ZK | |
| Přednášející: | Kreditů: | 7 | |
| Cvičící: | Semestr: | L | |
Anotace:
The course introduces the fundamentals of the fault-detection, fault tolerance, machine condition monitoring, vibrations based diagnostics, non-destructive testing and testing of analog and digital circuits.Osnovy přednášek:
| 1. | Diagnostics, prognostics, life cycle | |
| 2. | Fault modelling, signal/model based fault detection | |
| 3. | Reliability | |
| 4. | Fault tolerance, static/dynamic/analytical redundancy, FMEA, FMECA | |
| 5. | Performance evaluation of diagnostic methods (POD) | |
| 6. | Diagnostic signal sources and analysis, preprocessing | |
| 7. | Envelope, cepstral, order analysis, analysis of non-stationary signal | |
| 8. | Diagnostics of mechanical, electrical and electromechanical systems | |
| 9. | Diagnostics based on impulse and continuous acoustic emission | |
| 10. | Non-destructive Testing (NDT), Detection and Localization | |
| 11. | Ultrasonic NDT, Eddy Current NDT, active thermography | |
| 12. | Testing of analog and digital circuits, production testing | |
| 13. | In-circuit Testing, Built-in Self Test, Design for Test | |
| 14. | Test generation, fault masking, test compression, boundary scan |
Osnovy cvičení:
| 1. | Introduction to Diagnostics, Course Information, Schedule, Lab Practice and Electrical Safety | |
| 2. | Laboratory Experiment:Fault detection using thermography | |
| 3. | Laboratory Experiment: Vibrodiagnostics of shaft/gearbox | |
| 4. | Laboratory Experiment: Eddy Current Non-destructive Testing | |
| 5. | Laboratory Experiment: Ultrasonic Non-destructive Testing | |
| 6. | Quiz, Assignment of Individual Project | |
| 7. | Individual Project | |
| 8. | Individual Project | |
| 9. | Individual Project | |
| 10. | Individual Project | |
| 11. | Individual Project | |
| 12. | Individual Project | |
| 13. | Individual Project | |
| 14. | Presentation of Individual Project, Assessment |
Literatura:
| [1] | R. Isermann: Fault-Diagnosis Systems, Springer Verlag, 2006. |
| [2] | Ch. Hellier: Handbook of Nondestructive Evaluation, McGraw-Hill 2012. | |
| [3] | M. L. Bushnell, V.D. Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Springer, Boston, 2005. |
Požadavky:
Předmět je zahrnut do těchto studijních plánů:
| Plán | Obor | Role | Dop. semestr |
| Stránka vytvořena 19.4.2024 12:50:46, semestry: L/2023-4, Z/2024-5, Z/2023-4, připomínky k informační náplni zasílejte správci studijních plánů | Návrh a realizace: I. Halaška (K336), J. Novák (K336) |